Miscut measuring of SrTiO3 single crystal using high resolution X-ray diffraction

Miscut measuring of SrTiO3 single crystal using high resolution X-ray diffraction


Aziz M. Abdullah1, Salah R. Saeed1



1 Department of  Science, College of Basic Education l,  University of Charmo, Chamchamal, Kurdistan Region, Iraq 
E-mail: aziz-muhemed@hotmail.de , salah1966sh@gmail.com




Article info

Original: 13 Jan. 2015
Revised: 18 Mar. 2015
Accepted: 19 Apr. 2015
Published online: 20 Sep. 2015




Key Words:
Strontium titanate (SrTiO3)
High resolution X-ray diffraction
Substrate
Thin films
Miscut


Abstract
Strontium titanate (SrTiO3) is one of the perovskite type metal oxides with multi- functional properties and it has a lot of applications in various sectors of technology. In this paper, we obtained the miscut angles from Bragg peak after performing  scans of HRXRD at different angles of  with intervals of 90○. The obtained results located between 0.2015○ and 0.4302○ using two ways (mathematically and Epitaxy software), which is considered as a tolerance limit (less than 1°) to cut the substrates.








Ċ
Kewan Omer,
Sep 20, 2015, 9:22 AM